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AFM Probes - List of Manufacturers, Suppliers, Companies and Products

AFM Probes Product List

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Olympus OMCL-AC200TS equivalent AFM probe

Olympus OMCL-AC200TS equivalent AFM probe

For those looking for an alternative of equivalent quality to the Olympus OMCL series, which has been discontinued! This is the most versatile AFM probe/cantilever.

This product is equivalent to the OMCL-AC200TS from Olympus, which has been discontinued. Therefore, it can be used in the same way as conventional Olympus AFM probes. <Features of SPM-AC200S-AS> 1. Compatible with a wide range of samples This product, with its mid-range cantilever mechanical properties, is suitable for measuring a wide variety of samples, from soft materials to hard materials, including silicon semiconductors, glass, metals, and plastics. It is also suitable for use as a screening tool when measuring samples for which optimal cantilever mechanical properties are not yet determined. 2. Stable tip structure A stable and sharp probe achieved through sharpening treatment and experience in manufacturing conventional probes. The adoption of a tetrahedral shape allows for easy confirmation of the positional relationship between the sample and the probe when measuring with an SPM device combined with an optical microscope, facilitating accurate positioning adjustments.

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High-speed AFM: AFM/SPM probes and cantilevers

High-speed AFM: AFM/SPM probes and cantilevers

USC series with a maximum resonance frequency of 5 MHz for high-speed AFM measurements in air and liquid.

The "USC Cantilever" is a probe with a high resonance frequency that enables unprecedented high-speed response in both air and liquid environments. This product, which balances a high resonance frequency with a low spring constant, is widely used in high-speed AFM measurements that allow for dynamic observation of bio-samples and real-time observation of material surfaces. 【Features】 ■ Designed for high-speed scanning ■ The cantilever and probe are fixed to a single crystal silicon support chip ■ Straight cantilever with no inherent stress ■ Ribbon-shaped cantilever with rounded corners at the free end ■ Cantilever made of quartz-like material *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes
  • 3D measuring device
  • Other physicochemical equipment

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Olympus OMCL-AC160TS equivalent AFM probe

Olympus OMCL-AC160TS equivalent AFM probe

For those looking for an alternative of equivalent quality to the Olympus OMCL series, which has been discontinued! This is the most versatile AFM probe/cantilever.

This product is equivalent to the OMCL-AC160TS from Olympus, which has been discontinued. Therefore, it can be used in the same way as conventional Olympus AFM probes. <Features of SPM-AC160S-AS> 1. High-resolution measurement Combines a high Q value, a resonance frequency of 300 kHz (Typ.), and a spring constant of 26 N/m (Typ.) for softness. This minimizes damage to the sample and enables high-resolution measurement of surface roughness and high-sensitivity phase measurement. 2. Stable tip structure A stable sharp probe achieved through sharpening treatment and experience in manufacturing conventional probes. The adoption of a tetrahedral shape allows for easy confirmation of the positional relationship between the sample and the probe when measuring with an SPM device combined with an optical microscope, facilitating accurate positioning adjustments.

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Olympus OMCL-AC240TS equivalent AFM probe

Olympus OMCL-AC240TS equivalent AFM probe

For those looking for an alternative of equivalent quality to the Olympus OMCL series, which has been discontinued! This is the most versatile AFM probe/cantilever.

This product is equivalent to the OMCL-AC240TS from Olympus, which has been discontinued. Therefore, it can be used in the same way as conventional Olympus AFM probes. <Features of SPM-AC240S-AS> 1. Suitable for measuring viscoelasticity and soft samples It has mechanical properties with a small spring constant for dynamic mode (tapping mode), allowing for reduced load between the sample and the probe. This makes it suitable for measuring the shape and viscoelasticity of soft samples. 2. Stable tip structure A stable and sharp probe due to sharpening treatment and experience in manufacturing conventional probes. The adoption of a tetrahedral shape allows for easy confirmation of the positional relationship between the sample and the probe when measuring with an SPM device combined with an optical microscope, facilitating accurate positioning adjustments.

  • Other microscopes

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Olympus OMCL-AC55TS equivalent AFM probe

Olympus OMCL-AC55TS equivalent AFM probe

For those looking for an alternative of equivalent quality to the Olympus OMCL series, which has been discontinued! This is the most versatile AFM probe/cantilever.

This product is equivalent to the discontinued Olympus OMCL-AC55TS (gold-coated on the back). Therefore, it can be used in the same way as conventional Olympus AFM probes. <Features of SPM-AC55S-GS> 1. High-speed measurement with high resonance frequency in the megahertz range The high resonance frequency improves scan speed, significantly reducing image acquisition time. 2. High-resolution measurement achieved with low thermal noise cantilever The cantilever, which has a high resonance frequency and a high spring constant of 85 N/m (Nominal), enables high-resolution measurements while suppressing thermal noise. This is particularly expected to be applied in measurements at liquid-solid interfaces. Gold-coated products in other ranges are also available for sale.

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Olympus OMCL-AC240TM equivalent AFM probe

Olympus OMCL-AC240TM equivalent AFM probe

For those looking for an alternative of equivalent quality to the Olympus OMCL series, which has been discontinued! This is the most versatile AFM probe/cantilever.

The product is a compatible item for the discontinued Olympus OMCL-AC240TM. Therefore, it can be used just like the conventional Olympus AFM probes. <Features of SPM-AC240S-AP> 1. Platinum-coated probe for precise electrical property evaluation This cantilever is ideal for electrical property evaluations such as EFM, KFM, and SCM. The probe side is coated with platinum, providing stable conductivity. 2. Sharpness and conductivity combined The design with low resistance achieves high conductivity. Additionally, by finishing the probe tip to a sharp point, it enables high-resolution observation of the fine structures on the sample surface and highly sensitive measurements of electrical properties.

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